Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices - Woodhead Publishing Series in Electronic and Optical Materials - Cho, Yasuo (Tohoku University, Japan) - Books - Elsevier Science Publishing Co Inc - 9780128172469 - May 21, 2020
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Cho, Yasuo (Tohoku University, Japan)
Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices - Woodhead Publishing Series in Electronic and Optical Materials

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256 pages, Approx. 120 illustrations (30 in full color); Illustrations, unspecified

Media Books     Paperback Book   (Book with soft cover and glued back)
Released May 21, 2020
ISBN13 9780128172469
Publishers Elsevier Science Publishing Co Inc
Pages 256
Dimensions 151 × 229 × 40 mm   ·   349 g

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