Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition - Joseph Goldstein - Books - Springer Science+Business Media - 9780306472923 - January 31, 2003
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Joseph Goldstein
Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition Third Edition 2003 edition

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In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers.

709 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released January 31, 2003
ISBN13 9780306472923
Publishers Springer Science+Business Media
Pages 689
Dimensions 178 × 255 × 38 mm   ·   1.68 kg

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