Thin Film Materials: Stress, Defect Formation and Surface Evolution - Freund, L. B. (Brown University, Rhode Island) - Books - Cambridge University Press - 9780521822817 - January 8, 2004
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Freund, L. B. (Brown University, Rhode Island)
Thin Film Materials: Stress, Defect Formation and Surface Evolution

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Thin film mechanical behavior and stress presents a technological challenge for materials scientists, physicists and engineers. Describing fundamental concepts with practical case studies, highly illustrated, thorough referencing and containing numerous homework problems, this book will be essential for graduate courses on thin films and the classic reference for researchers.

770 pages, 75 b/w illus. 75 exercises

Media Books     Hardcover Book   (Book with hard spine and cover)
Released January 8, 2004
ISBN13 9780521822817
Publishers Cambridge University Press
Pages 770
Dimensions 180 × 255 × 43 mm   ·   1.64 kg   (Weight (estimated))
Language English  

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