Defects in SiO2 and Related Dielectrics: Science and Technology - NATO Science Series II - Gianfranco Pacchioni - Books - Springer - 9780792366867 - December 31, 2000
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Defects in SiO2 and Related Dielectrics: Science and Technology - NATO Science Series II Softcover reprint of the original 1st ed. 2000 edition

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Proceedings of the NATO Advanced Study Institute, Erice, Italy, April 8-20, 2000


624 pages, 87 black & white illustrations, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released December 31, 2000
ISBN13 9780792366867
Publishers Springer
Pages 624
Dimensions 153 × 234 × 20 mm   ·   875 g
Language English  
Editor Griscom, David L.
Editor Pacchioni, Gianfranco
Editor Skuja, Linards

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