Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments - Springer Tracts in Advanced Robotics - Hui Xie - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783642445019 - November 26, 2014
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Hui Xie
Atomic Force Microscopy Based Nanorobotics: Modelling, Simulation, Setup Building and Experiments - Springer Tracts in Advanced Robotics 2012 edition

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The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s.

344 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released November 26, 2014
ISBN13 9783642445019
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 344
Dimensions 155 × 235 × 19 mm   ·   503 g
Language English  

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