Semiconductor Interfaces: Formation and Properties: Proceedings of the Workkshop, Les Houches, France February 24–March 6, 1987 - Springer Proceedings in Physics - Guy Lelay - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783642729690 - December 6, 2011
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Guy Lelay
Semiconductor Interfaces: Formation and Properties: Proceedings of the Workkshop, Les Houches, France February 24–March 6, 1987 - Springer Proceedings in Physics Softcover Reprint of the Original 1st 1987 edition

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(ii) Fine characterization down to the atomic scale using recently devel­ oped, powerful techniques such as scanning tunneling microscopy, high reso­ lution transmission electron microscopy, glancing incidence x-ray diffraction, x-ray standing waves, surface extended x-ray absorption fine structure and surface extended energy-loss fine structure.

408 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released December 6, 2011
ISBN13 9783642729690
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 389
Dimensions 173 × 245 × 21 mm   ·   648 g
Language German  
Editor Boccara, Nino
Editor Derrien, Jacques
Editor LeLay, Guy

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