Test Generation of Crosstalk Delay Faults in VLSI Circuits - S. Jayanthy - Books - Springer Verlag, Singapore - 9789811347849 - December 21, 2018
In case cover and title do not match, the title is correct

S. Jayanthy
Test Generation of Crosstalk Delay Faults in VLSI Circuits Softcover Reprint of the Original 1st 2019 edition

Get an email once the item is available
Do you have a profile? Log in
Get notified about new S. Jayanthy releases

Our customers say:

14-day return policy in accordance with European consumer protection law
Top ranking on Trustpilot
Add to your iMusic wish list

Not rated yet

The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults.

156 pages, 30 Tables, color; 7 Illustrations, color; 42 Illustrations, black and white; XI, 156 p. 4

Media Books     Paperback Book   (Book with soft cover and glued back)
Released December 21, 2018
ISBN13 9789811347849
Publishers Springer Verlag, Singapore
Pages 156
Dimensions 150 × 220 × 10 mm   ·   454 g

More from the same publisher

See all of S. Jayanthy ( e.g. Paperback Book )