Fundamentals of Atomic Force Microscopy - Part I: Foundations - Lessons from Nanoscience: a Lecture Notes Series - Reifenberger, Ronald (Purdue University, USA) - Books - World Scientific Publishing Co Pte Ltd - 9789814630344 - November 12, 2015
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Reifenberger, Ronald (Purdue University, USA)
Fundamentals of Atomic Force Microscopy - Part I: Foundations - Lessons from Nanoscience: a Lecture Notes Series

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The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution.

350 pages

Media Books     Hardcover Book   (Book with hard spine and cover)
Released November 12, 2015
ISBN13 9789814630344
Publishers World Scientific Publishing Co Pte Ltd
Pages 342
Dimensions 158 × 238 × 23 mm   ·   614 g

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