Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing - Erik Larsson - Books - Springer-Verlag New York Inc. - 9781402032073 - November 7, 2005
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Erik Larsson
Introduction to Advanced System-on-Chip Test Design and Optimization - Frontiers in Electronic Testing 2005 edition

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SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling.

388 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released November 7, 2005
ISBN13 9781402032073
Publishers Springer-Verlag New York Inc.
Pages 388
Dimensions 156 × 232 × 23 mm   ·   1.09 kg
Language English  

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