Microscopy of Semiconducting Materials 2007: Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK - Springer Proceedings in Physics - - Books - Springer-Verlag New York Inc. - 9781402086144 - September 18, 2008
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Microscopy of Semiconducting Materials 2007: Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK - Springer Proceedings in Physics 2008 edition

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In view of this scenario, the vital importance of transmission and scanning electron microscopy, together with X-ray and scanning probe approaches can immediately be seen. The conference featured developments in high resolution microscopy and nanoanalysis, including the exploitation of recently introduced aberration-corrected electron microscopes.

512 pages, Illustrations (some col.)

Media Books     Hardcover Book   (Book with hard spine and cover)
Released September 18, 2008
ISBN13 9781402086144
Publishers Springer-Verlag New York Inc.
Pages 498
Dimensions 155 × 235 × 25 mm   ·   975 g
Editor Cullis, A.G.
Editor Midgley, P.A.

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